Title :
Large band offset short calibration procedure for vector network analysers
Author_Institution :
DAEIMI, Universita degli Studi di Cassino, Italy
fDate :
3/20/2003 12:00:00 AM
Abstract :
A method to evaluate the positions of the short circuit to obtain a stable offset short calibration in an arbitrarily large frequency range is presented. The method is tested by evaluating the permittivity of a sample of fibreglass placed in a waveguide using the Von Hippel method.
Keywords :
calibration; microwave measurement; network analysers; permittivity measurement; Von Hippel method; fibreglass; offset short calibration; permittivity measurement; short circuit; vector network analyser; waveguide;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030343
