Title :
A High-Linearity Single-Pole-Double-Throw Pseudomorphic HEMT Switch Based on Tunable Field-Plate Voltage Technology
Author :
Chiu, Hsien-Chin ; Cheng, Chia-Shih ; Lin, Shao-Wei ; Wei, Chien-Cheng
Author_Institution :
Dept. of Electron. Eng., Chang Gung Univ., Taoyuan
fDate :
4/1/2009 12:00:00 AM
Abstract :
A high-isolation high-linearity GaAs pseudomorphic high-electron mobility transistor single-pole-double-throw microwave switch was developed using a tunable field-plate (FP) bias voltage technology. In this paper, a piece of FP metal was deposited between 0.15-mum-long gate and drain terminals. An extra FP-induced depletion region was generated to suppress the harmonics of switching associated with OFF-state operation. When switching into the ON-state, the FP switch is associated with an insertion loss similar to that of the standard switch below 6 GHz. However, the isolation performance can be enhanced by 10 dB using an FP technology, which reduces the OFF-state capacitance that is produced by the extra FP-induced depletion region. The FP provides an additional mechanism to suppress the power of the second- and third-order harmonics in the OFF-state with slight ON-state insertion-loss degradation.
Keywords :
HEMT circuits; III-V semiconductors; gallium arsenide; microwave switches; transceivers; GaAs; high linearity single-pole double-throw pseudomorphic HEMT switch; high-isolation high-linearity pseudomorphic high-electron mobility transistor; single-pole-double-throw microwave switch; size 0.15 mum; tunable field-plate voltage technology; Gallium arsenide; HEMTs; Insertion loss; Isolation technology; MODFETs; Microwave technology; Microwave transistors; PHEMTs; Switches; Voltage; Field plate (FP); high linearity; microwave switch; pseudomorphic high-electron mobility transistor (pHEMT);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2009.2014189