DocumentCode :
1174746
Title :
Response Errors of Impulse Test Circuits
Author :
Hyltén-Cavallius, N. ; Ghagas, F.A. ; Silva, M. Appel da
Author_Institution :
Centro de Pesquisas de Energia Eletrica (CEPEL)
Issue :
11
fYear :
1984
Firstpage :
3276
Lastpage :
3285
Abstract :
Simulations of numerous impulse voltage test and neasuring circuits show that subject to restrictions cn the time to steady state a set of three step response pararneters is necessary and sufficient to Limit response errors. Fewer paraneters can only be used for special cases.
Keywords :
Circuit testing; Impulse testing; Instrumentation and measurement; Power system measurements; Power system simulation; Pulse measurements; Shape measurement; Steady-state; Transactions Committee; Voltage;
fLanguage :
English
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9510
Type :
jour
DOI :
10.1109/TPAS.1984.318569
Filename :
4112442
Link To Document :
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