DocumentCode :
11750
Title :
An Estimation of Single Photon Avalanche Diode (SPAD) Photon Detection Efficiency (PDE) Nonuniformity
Author :
Savuskan, V. ; Brouk, Igor ; Javitt, M. ; Nemirovsky, Yael
Author_Institution :
Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa, Israel
Volume :
13
Issue :
5
fYear :
2013
fDate :
May-13
Firstpage :
1637
Lastpage :
1640
Abstract :
An analytical expression estimating the photon detection efficiency (PDE) nonuniformity of single-photon avalanche diodes is derived. The estimation relies upon well-established semiempirical and analytical models and is useful for medium- to high-resolution arrays, as well as for wafer-to-wafer variations. While the only explicit example presented so far is for 1-D estimation based on breakdown voltage variation, the proposed PDE nonuniformity estimation algorithm can be expanded to additional dimensions so as to incorporate spread in technological parameters such as junction depth, well depth, and local defects.
Keywords :
Awards activities; Biomedical measurements; CMOS integrated circuits; Electrical engineering; Estimation; Photonics; Voltage measurement; Avalanche breakdown; CMOS integrated circuits; image sensors; photodiodes;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2013.2240154
Filename :
6412705
Link To Document :
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