Title :
An Estimation of Single Photon Avalanche Diode (SPAD) Photon Detection Efficiency (PDE) Nonuniformity
Author :
Savuskan, V. ; Brouk, Igor ; Javitt, M. ; Nemirovsky, Yael
Author_Institution :
Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa, Israel
Abstract :
An analytical expression estimating the photon detection efficiency (PDE) nonuniformity of single-photon avalanche diodes is derived. The estimation relies upon well-established semiempirical and analytical models and is useful for medium- to high-resolution arrays, as well as for wafer-to-wafer variations. While the only explicit example presented so far is for 1-D estimation based on breakdown voltage variation, the proposed PDE nonuniformity estimation algorithm can be expanded to additional dimensions so as to incorporate spread in technological parameters such as junction depth, well depth, and local defects.
Keywords :
Awards activities; Biomedical measurements; CMOS integrated circuits; Electrical engineering; Estimation; Photonics; Voltage measurement; Avalanche breakdown; CMOS integrated circuits; image sensors; photodiodes;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2013.2240154