• DocumentCode
    1175433
  • Title

    Success-driven learning in ATPG for preimage computation

  • Author

    Sheng, Shuo ; Hsiao, Michael S.

  • Volume
    21
  • Issue
    6
  • fYear
    2004
  • Firstpage
    504
  • Lastpage
    512
  • Abstract
    Unbounded model checking fundamentally requires either image or preimage calculations. We introduce a hybrid method for making preimage calculations using ATPG and binary decision diagrams (BDDs). Experimental results show that the proposed method achieves a speedup of two to three orders of magnitude over pure ATPG methods.
  • Keywords
    automatic test pattern generation; binary decision diagrams; computability; formal verification; logic circuits; logic simulation; logic testing; tree searching; ATPG preimage computation; binary decision diagram; success-driven learning; unbounded model checking; Automatic test pattern generation; Binary decision diagrams; Boolean functions; Circuits; Computational modeling; Data structures; Decision making; Engines; Formal verification; State-space methods;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2004.97
  • Filename
    1363705
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1175433