• DocumentCode
    1175457
  • Title

    Jitter measurements of high-speed serial links

  • Author

    Kossel, Marcel A. ; Schmatz, Martin L.

  • Author_Institution
    IBM Zurich Res. Lab., Ruschlikon, Switzerland
  • Volume
    21
  • Issue
    6
  • fYear
    2004
  • Firstpage
    536
  • Lastpage
    543
  • Abstract
    Jitter is one of the most important issues in the design and operation of high-speed serial links. We focus on the BERT scan method, a jitter characterization method based on scanning the bit error rate within the eye diagram.
  • Keywords
    timing circuits; timing jitter; BERT scan method; BIST function; bit error rate; eye diagram; high-speed serial links; jitter characterization method; jitter measurement; Bit error rate; Clocks; Density functional theory; Frequency; Histograms; Jitter; Laboratories; Random processes; Signal analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2004.93
  • Filename
    1363708
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1175457