Title :
Fault classification of phase to phase fault in six phase transmission line using Haar wavelet and ANN
Author :
Kumar, Ravindra ; Koley, Ebha ; Yadav, Ankesh ; Thoke, A.S.
Author_Institution :
Dept. Of Electr. Eng., Nat. Inst. Of Technol., Raipur, India
Abstract :
This paper presents a fault classification technique based on Haar Wavelet Transform (WT) and Artificial Neural Network (ANN) for six phase transmission line against phase to phase faults. The approximation & detailed coefficients of voltage & current signals are extracted using Haar WT. The standard deviation (SD) of approximated coefficient of voltage & current samples is used as input to the neural network for classification purpose. Six phase transmission line is modeled and the proposed protection technique has been developed using the Simulink® and Simpowersystem® toolboxes of MATLAB®7.01. The effect of variation of fault parameters such as fault distance location, resistance and inception angle are also considered. The simulation result of Haar WT and ANN based fault classifier is presented in this paper. This has been discovered that the proposed method classifies all types of phase-to-phase fault accurately. Thus simulation results demonstrate the suitability and effectiveness of the proposed algorithm.
Keywords :
Haar transforms; fault location; neural nets; power engineering computing; power transmission faults; power transmission lines; wavelet transforms; ANN; Haar wavelet transform; MATLAB 7.01; SD; Simpowersystem toolboxes; Simulink toolboxes; WT; artificial neural network; current samples; current signals; fault classification technique; fault distance location; fault resistance; inception angle; phase-to-phase fault; six phase transmission line; standard deviation; voltage samples; voltage signals; Artificial neural networks; Circuit faults; Classification algorithms; Power transmission lines; Signal processing algorithms; Wavelet transforms; Artificial Neural Network (ANN); Haar Wavelet Transform (WT); Six phase transmission line; Standard Deviation (SD);
Conference_Titel :
Signal Processing and Integrated Networks (SPIN), 2014 International Conference on
Conference_Location :
Noida
Print_ISBN :
978-1-4799-2865-1
DOI :
10.1109/SPIN.2014.6776911