• DocumentCode
    1175675
  • Title

    Computer enhancement of scanning electron micrographs

  • Author

    Lewis, Burn L. ; Sakrison, David J.

  • Volume
    22
  • Issue
    3
  • fYear
    1975
  • fDate
    3/1/1975 12:00:00 AM
  • Firstpage
    267
  • Lastpage
    278
  • Abstract
    This paper deals with the digital restoration of scanning electron micrographs. The properties of the signal and noise generated when recording a micrograph are analyzed and used to develop the optimal Wiener filter for enhancing the image. The transfer function of the display device, as well as the frequency foldover produced by sampling the image are included in the model. The mean-square-error measure is used in deriving the optimal filter, and it is shown that weighting this measure to reflect the spatial frequency response of the eye is of no benefit. A number of micrographs illustrate the success of restoration at different magnifications. In the opinion of some microscopists, the computer enhancement has produced significant, although not dramatic, improvements in the quality of the images.
  • Keywords
    Filtering and enhancement; Image enhancement; Scanning electron microscopy; Electrons; Frequency measurement; Image analysis; Image restoration; Noise generators; Signal analysis; Signal generators; Signal restoration; Transfer functions; Wiener filter;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1975.1084027
  • Filename
    1084027