DocumentCode :
1175675
Title :
Computer enhancement of scanning electron micrographs
Author :
Lewis, Burn L. ; Sakrison, David J.
Volume :
22
Issue :
3
fYear :
1975
fDate :
3/1/1975 12:00:00 AM
Firstpage :
267
Lastpage :
278
Abstract :
This paper deals with the digital restoration of scanning electron micrographs. The properties of the signal and noise generated when recording a micrograph are analyzed and used to develop the optimal Wiener filter for enhancing the image. The transfer function of the display device, as well as the frequency foldover produced by sampling the image are included in the model. The mean-square-error measure is used in deriving the optimal filter, and it is shown that weighting this measure to reflect the spatial frequency response of the eye is of no benefit. A number of micrographs illustrate the success of restoration at different magnifications. In the opinion of some microscopists, the computer enhancement has produced significant, although not dramatic, improvements in the quality of the images.
Keywords :
Filtering and enhancement; Image enhancement; Scanning electron microscopy; Electrons; Frequency measurement; Image analysis; Image restoration; Noise generators; Signal analysis; Signal generators; Signal restoration; Transfer functions; Wiener filter;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1975.1084027
Filename :
1084027
Link To Document :
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