• DocumentCode
    11757
  • Title

    Worst Case Noise Prediction With Nonzero Current Transition Times for Power Grid Planning

  • Author

    Xiang Hu ; Peng Du ; Shih-Hung Weng ; Chung-kuan Cheng

  • Author_Institution
    Broadcom Corp., San Diego, CA, USA
  • Volume
    22
  • Issue
    3
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    607
  • Lastpage
    620
  • Abstract
    In this paper, we propose a novel method for power distribution network verification at early design stages. This approach predicts the worst case noise of on-chip power grids with multiple current sources subjected to a set of hierarchical constraints. The current constraints not only define bounds for current magnitudes, but also consider nonzero current transition times that makes the prediction of worst case noise more realistic. Under the novel current constraints, a dynamic programming algorithm is introduced to generate the worst case current sources based on the impulse responses of the power grid. The algorithm is accelerated by a modified Knuth-Yao quadrangle inequality speedup method, which reduces the time complexity from O(s2m) to O(smlogs), where s is the number of discretized current values and m is the total number of zero-crossing points of the current sources. Experimental results show that our approach not only efficiently predicts realistic worst case noise of on-chip power grids, but also correlates the frequency-domain resonance effects with the time-domain noise behavior.
  • Keywords
    constant current sources; dynamic programming; integrated circuit noise; printed circuit interconnections; current constraints; dynamic programming algorithm; early design stages; frequency-domain resonance effects; hierarchical constraints; impulse responses; modified Knuth-Yao quadrangle inequality speedup method; multiple current sources; nonzero current transition times; on-chip power grids; power distribution network verification; time-domain noise behavior; worst case current sources; worst case noise; zero-crossing points; Current transition time; multiple current sources; power grid verification; power integrity; worst case noise;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2013.2252210
  • Filename
    6495483