Title :
Efficient reconfigurable techniques for VLSI arrays with 6-port switches
Author :
Jigang, Wu ; Srikanthan, Thambipillai ; Schröder, Heiko
Author_Institution :
Centre for High Performance Embedded Syst., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
This paper proposes an efficient techniques to reconfigure a two-dimensional degradable very large scale integration/wafer scale integration (VLSI/WSI) array under the row and column routing constraints, which has been shown to be NP-complete. The proposed VLSI/WSI array consists of identical processing elements such as processors or memory cells embedded in a 6-port switch lattice in the form of a rectangular grid. It has been shown that the proposed VLSI structure with 6-port switches eliminates the need to incorporate internal bypass within processing elements and leads to notable increase in the harvest when compared with the one using 4-port switches. A new greedy rerouting algorithm and compensation approaches are also proposed to maximize harvest through reconfiguration. Experimental results show that the proposed VLSI array with 6-port switches consistently outperforms the most efficient alternative proposed in literature, toward maximizing the harvest in the presence of fault processing elements.
Keywords :
circuit complexity; fault tolerance; greedy algorithms; network routing; switches; wafer-scale integration; 4-port switch; 6-port switch; NP-complete; VLSI routing; VLSI structure; VLSI/WSI array; compensation approach; fault processing element; fault-tolerance; greedy rerouting algorithm; identical processing element; very large scale integration; wafer scale integration; Algorithm design and analysis; Circuit faults; Degradation; Fault tolerance; Greedy algorithms; Logic arrays; Routing; Switches; Very large scale integration; Wafer scale integration; Degradable very large scale integration/wafer scale integration (VLSI/WSI) array; VLSI routing; fault-tolerance; greedy algorithm; reconfiguration;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2005.853603