Design and analysis of compact dictionaries for diagnosis in scan-BIST

Author

Liu, Chunsheng ; Chakrabarty, Krishnendu

Author_Institution

Dept. of Comput. & Electron. Eng., Univ. of Nebraska-Lincoln, Omaha, USA

Volume

13

Issue

8

fYear

2005

Firstpage

979

Lastpage

984

Abstract

We present a new technique for generating compact dictionaries for cause-effect diagnosis in scan-BIST. This approach relies on the use of three compact dictionaries and target both modeled and unmodeled faults. We present analytical results that provide useful guidelines for the design of these compact dictionaries. We also present experimental results for the larger ISCAS-89 benchmark circuits for the diagnosis of various types of unmodeled faults.

Keywords

benchmark testing; built-in self test; fault diagnosis; logic testing; shift registers; ISCAS-89 benchmark circuit; LFSR; cause-effect diagnosis; compact dictionary; diagnostic resolution; fault diagnosis; interval-based dictionary; linear feedback shift register; scan-BIST; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Compaction; Dictionaries; Fault diagnosis; Guidelines; Linear feedback shift registers; Very large scale integration; Compaction; diagnostic resolution; fault diagnosis; interval-based dictionary; linear feedback shift register (LFSR);

fLanguage

English

Journal_Title

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

Publisher

ieee

ISSN

1063-8210

Type

jour

DOI

10.1109/TVLSI.2005.853624

Filename

1512186