• DocumentCode
    1176209
  • Title

    Improved Radar System Reliability by Performance Tolerance Analysis

  • Author

    Sellers, William H.

  • Author_Institution
    Raytheon Company, Bedford, Massachusetts
  • Issue
    4
  • fYear
    1966
  • fDate
    7/1/1966 12:00:00 AM
  • Firstpage
    220
  • Lastpage
    222
  • Keywords
    Circuits; Degradation; Electric breakdown; Failure analysis; Life estimation; Performance analysis; Radar; Reliability engineering; Stacking; Tolerance analysis;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/TAES.1966.4501844
  • Filename
    4501844