CVD diamond films for radiation detection

Author

Foulon, F. ; Pochet, T. ; Gheeraert, E. ; Deneuville, A.

Author_Institution

Centre d´´Etudes de Saclay, CEA, Gif-sur-Yvette, France

Volume

41

Issue

4

fYear

1994

fDate

8/1/1994 12:00:00 AM

Firstpage

927

Lastpage

932

Abstract

Diamond films produced by microwave plasma enhanced chemical vapor deposition (CVD) technique have been used to fabricate radiation detectors. The polycrystalline diamond films have a measured resistivity of 10¹² Ω.cm, a carrier mobility of 280 cm²/V.s and a carrier lifetime of about 530 ps. The detector response to laser pulses (λ=355, 532 and 1064 nm), X-ray flux (15-50 keV) and alpha particles (²⁴¹Am, 5.49 MeV) has been investigated. The response speed of the detector is in the 100 ps range. A sensitivity of about 3×10^-10A/V.(Gy/s) was measured under a 50 keV X-ray flux. The detector current response to X-ray flux is almost linear. It is also shown that CVD diamond detectors can be used for alpha particle counting

Keywords

CVD coatings; X-ray detection and measurement; alpha-particle detection and measurement; carrier lifetime; carrier mobility; diamond; electronic conduction in crystalline semiconductor thin films; elemental semiconductors; semiconductor counters; semiconductor thin films; 100 ps; 1064 nm; 15 to 50 keV; 355 nm; 5.49 MeV; 532 nm; C; CVD; X-ray; alpha particle counting; alpha particles; carrier lifetime; carrier mobility; chemical vapor deposition; diamond films; laser pulse; microwave plasma; radiation detector; resistivity; response speed; semiconductor; sensitivity; Alpha particles; Chemical vapor deposition; Conductivity; Microwave theory and techniques; Plasma chemistry; Plasma measurements; Radiation detectors; X-ray detection; X-ray detectors; X-ray lasers;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.322833

Filename

322833