• DocumentCode
    1176537
  • Title

    A High Speed Technique for Testing Spacecraft Telemetry Systems

  • Author

    Horrell, Joel

  • Author_Institution
    McDonnell Aircraft Corporation St. Louis, Missouri
  • Issue
    4
  • fYear
    1966
  • fDate
    7/1/1966 12:00:00 AM
  • Firstpage
    482
  • Lastpage
    488
  • Abstract
    Present methods of automatically testing spacecraft PCM telemetry systems utilize a one or two channel decoding scheme in which channel inputs are programmed from a precision voltage source and the PCM output from each channel under test is observed or compared one data channel at a time to a reference word value. This method has the disadvantages of being time consuming, placing extreme requirements upon the precision voltage source in voltage accuracy and ambient noise, and failing to simulate realistic data configurations in the output serial PCM wavetrain. A high speed technique which overcomes these advantages establishes a reference PCM data train from a reference PCM system which is electrically identical to the PCM system under test and is synchronized bit by bit so that a real time comparison to the reference PCM data train may be made. Word identification is maintained to identify channel location of errors in the system under test. By this method eleven point channel accuracy testing of a Gemini type format of 240 channels can be reduced from the present 90 minutes to 27 seconds. Since both PCM data trains are synchronized sampling times of the A/D converters are precisely at the same point in time and since corresponding channels are driven from the same source an inaccuracy due to voltage programming or test set ambient noise on the data input line is nullified.
  • Keywords
    Automatic testing; Decoding; High-speed electronics; Phase change materials; Real time systems; Sampling methods; Space vehicles; System testing; Telemetry; Voltage;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/TAES.1966.4501879
  • Filename
    4501879