DocumentCode :
1176678
Title :
Transmission measurement of tapered single-line defect photonic crystal waveguides
Author :
Xing, Aimin ; Davanço, Marcelo ; Blumenthal, Daniel J. ; Hu, Evelyn L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA, USA
Volume :
17
Issue :
10
fYear :
2005
Firstpage :
2092
Lastpage :
2094
Abstract :
Two-dimensional tapered single-line defect photonic crystal (PC) waveguides were fabricated with coupled ridge waveguides in InP-InGaAsP and optical transmission characteristics measured. Three different taper designs that optimized both mode size match and impedance match between the accessing ridge waveguides and the PC waveguides were fabricated and characterized. An ∼8-dB improvement of coupling efficiency was observed for the tapered structures over untapered.
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; impedance matching; indium compounds; integrated optics; optical design techniques; optical fabrication; optical waveguides; photonic crystals; ridge waveguides; accessing ridge waveguides; coupled ridge waveguides; coupling efficiency; impedance match; mode size match; optical transmission characteristics; photonic crystal waveguides; single-line defect waveguides; taper designs; tapered waveguides; transmission measurements; two-dimensional photonic crystal; waveguide fabrication; Biomembranes; Coupling circuits; Etching; Fiber nonlinear optics; Optical coupling; Optical waveguides; Personal communication networks; Photonic crystals; Photonic integrated circuits; Propagation losses; Integrated optics; photonic crystals (PCs); waveguides;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2005.856418
Filename :
1512283
Link To Document :
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