• DocumentCode
    1177088
  • Title

    An analog memory integrated circuit for waveform sampling up to 900 MHz

  • Author

    Haller, Gunther M. ; Wooley, Bruce A.

  • Author_Institution
    Linear Accel. Center, Stanford Univ., CA, USA
  • Volume
    41
  • Issue
    4
  • fYear
    1994
  • fDate
    8/1/1994 12:00:00 AM
  • Firstpage
    1203
  • Lastpage
    1207
  • Abstract
    The design and implementation of a switched-capacitor memory suitable for capturing high-speed analog waveforms is described. Highlights of the presented circuit are a 900 MHz sampling frequency (generated on chip), input signal independent cell pedestals and sampling instances, and cell gains that are insensitive to component sizes. A two-channel version of the memory with 32 cells for each channel has been integrated in a 2-μm complementary metal oxide semiconductor (CMOS) process with polysilicon-to-polysilicon capacitors. The measured rms cell response variation in a channel after cell pedestal subtraction is less than 0.3 mV across the full input signal range. The cell-to-cell gain matching is better than 0.01% rms, and the nonlinearity is less than 0.03% for a 2.5-V input range. The dynamic range of the memory exceeds 13 bits, and the peak signal-to-(noise+distortion) ratio for a 21.4 MHz sine wave sampled at 900 MHz is 59 dB
  • Keywords
    CMOS integrated circuits; analogue processing circuits; analogue storage; application specific integrated circuits; linear integrated circuits; nuclear electronics; switched capacitor networks; waveform analysis; 0.3 mV; 2 mum; 2.5 V; 21.4 MHz; 59 dB; 900 MHz; CMOS process; RMS cell response variation; Si; analog memory integrated circuit; cell gains; cell-to-cell gain matching; high-speed analog waveforms; input signal independent cell pedestals; polysilicon-to-polysilicon capacitors; sampling frequency; switched-capacitor memory; two-channel version; waveform sampling; Analog integrated circuits; Analog memory; CMOS process; Capacitors; Dynamic range; Frequency; Sampling methods; Semiconductor device measurement; Signal generators; Signal sampling;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.322884
  • Filename
    322884