DocumentCode :
1177088
Title :
An analog memory integrated circuit for waveform sampling up to 900 MHz
Author :
Haller, Gunther M. ; Wooley, Bruce A.
Author_Institution :
Linear Accel. Center, Stanford Univ., CA, USA
Volume :
41
Issue :
4
fYear :
1994
fDate :
8/1/1994 12:00:00 AM
Firstpage :
1203
Lastpage :
1207
Abstract :
The design and implementation of a switched-capacitor memory suitable for capturing high-speed analog waveforms is described. Highlights of the presented circuit are a 900 MHz sampling frequency (generated on chip), input signal independent cell pedestals and sampling instances, and cell gains that are insensitive to component sizes. A two-channel version of the memory with 32 cells for each channel has been integrated in a 2-μm complementary metal oxide semiconductor (CMOS) process with polysilicon-to-polysilicon capacitors. The measured rms cell response variation in a channel after cell pedestal subtraction is less than 0.3 mV across the full input signal range. The cell-to-cell gain matching is better than 0.01% rms, and the nonlinearity is less than 0.03% for a 2.5-V input range. The dynamic range of the memory exceeds 13 bits, and the peak signal-to-(noise+distortion) ratio for a 21.4 MHz sine wave sampled at 900 MHz is 59 dB
Keywords :
CMOS integrated circuits; analogue processing circuits; analogue storage; application specific integrated circuits; linear integrated circuits; nuclear electronics; switched capacitor networks; waveform analysis; 0.3 mV; 2 mum; 2.5 V; 21.4 MHz; 59 dB; 900 MHz; CMOS process; RMS cell response variation; Si; analog memory integrated circuit; cell gains; cell-to-cell gain matching; high-speed analog waveforms; input signal independent cell pedestals; polysilicon-to-polysilicon capacitors; sampling frequency; switched-capacitor memory; two-channel version; waveform sampling; Analog integrated circuits; Analog memory; CMOS process; Capacitors; Dynamic range; Frequency; Sampling methods; Semiconductor device measurement; Signal generators; Signal sampling;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.322884
Filename :
322884
Link To Document :
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