• DocumentCode
    1177612
  • Title

    Fault diagnosis and logic debugging using Boolean satisfiability

  • Author

    Smith, Alexander ; Veneris, Andreas ; Ali, Moayad Fahim ; Viglas, Anastasios

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada
  • Volume
    24
  • Issue
    10
  • fYear
    2005
  • Firstpage
    1606
  • Lastpage
    1621
  • Abstract
    Recent advances in Boolean satisfiability have made it an attractive engine for solving many digital very-large-scale-integration design problems. Although useful in many stages of the design cycle, fault diagnosis and logic debugging have not been addressed within a satisfiability-based framework. This work proposes a novel Boolean satisfiability-based method for multiple-fault diagnosis and multiple-design-error diagnosis in combinational and sequential circuits. A number of heuristics are presented that keep the method memory and run-time efficient. An extensive suite of experiments on large circuits corrupted with different types of faults and errors confirm its robustness and practicality. They also suggest that satisfiability captures significant characteristics of the problem of diagnosis and encourage novel research in satisfiability-based diagnosis as a complementary process to design verification.
  • Keywords
    Boolean algebra; VLSI; combinational circuits; computability; fault diagnosis; logic design; logic testing; sequential circuits; Boolean satisfiability; combinational circuits; digital very-large-scale-integration design; integrated circuit design; logic debugging; logic design; logic testing; multiple design error diagnosis; multiple fault diagnosis; sequential circuits; Boolean functions; Circuit faults; Debugging; Engines; Fault diagnosis; Logic design; Robustness; Runtime; Sequential circuits; Very large scale integration; Boolean satisfiability debugging; VLSI; design errors; diagnosis; faults; verification;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.852031
  • Filename
    1512377