DocumentCode
1178187
Title
Calibrated measurement of optoelectronic frequency response
Author
Hale, Paul D. ; Williams, Dylan F.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume
51
Issue
4
fYear
2003
fDate
4/1/2003 12:00:00 AM
Firstpage
1422
Lastpage
1429
Abstract
Describes the most straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.
Keywords
S-matrix theory; calibration; network analysers; optical receivers; optoelectronic devices; calibrated measurement; calibrated optical reference receiver; electrical vector network analyzer; modulated optical source; optoelectronic devices; optoelectronic frequency response; scattering matrix formalism; Calibration; Chirp modulation; Frequency measurement; Frequency response; Light scattering; Optical modulation; Optical receivers; Optical scattering; Optoelectronic devices; Voltage;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2003.809186
Filename
1193160
Link To Document