Title :
Comparison and Reduction of Conducted EMI in SiC JFET and Si IGBT-Based Motor Drives
Author :
Xun Gong ; Ferreira, Jan Abraham
Author_Institution :
Dept. of Electr. Eng., Math. & Comput. Sci., Electr. Power Process. Group, Delft Univ. of Technol., Delft, Netherlands
Abstract :
This paper compares the conducted electromagnetic interference (EMI) in Si insulated gate bipolar transistor (IGBT) and silicon carbide (SiC) junction field-effect transistor (JFET) based motor drives. Two inverters, with the SiC and Si transistors, respectively, are built using the same circuit layout and investigated accordingly. Their conducted EMI levels are compared under the conditions of without filter and with traditional common mode (CM) filters. Reasons of the exhibited different noise emissions are analyzed. To verify the discussions, two inverters are tested in the CM. This allows for the identification and analysis of their maximized CM and differential mode (DM) wave shapes. It is shown that the excited parasitic oscillations during the switching transients are magnified more in the SiC JFET inverter, which is the main cause of the noise difference. Lastly, improved filtering solutions are proposed, which effectively suppressed the increased high-frequency noise due to the faster SiC switching speed.
Keywords :
electromagnetic interference; insulated gate bipolar transistors; integrated circuit layout; invertors; junction gate field effect transistors; motor drives; semiconductor device noise; silicon compounds; switching transients; wide band gap semiconductors; CM filters; DM wave shapes; EMI levels; JFET based motor drives; JFET inverter; SiC; circuit layout; common mode filters; conducted electromagnetic interference; differential mode; filtering solutions; high-frequency noise; insulated gate bipolar transistor; inverters; junction field-effect transistor based motor drives; noise difference; noise emissions; parasitic oscillations; silicon IGBT-based motor drives; silicon carbide JFET; silicon carbide junction field-effect transistor; switching speed; switching transients; Electromagnetic compatibility (EMC); electromagnetic interference (EMI); filter; insulated gate bipolar transistor (IGBT); motor drive; silicon carbide (SiC) junction field-effect transistor (JFET);
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2013.2271301