Title :
A built-in test module for fault isolation
Author :
Vasanthavada, Nagesh ; Kanopoulos, Nick
Author_Institution :
Research Triangle Inst., Research Triangle Park, NC, USA
fDate :
6/1/1989 12:00:00 AM
Abstract :
A broad-level implementation of signature analysis that uses a built-in test module called a testing switch is presented. It is shown how board designers can incorporate the testing-switch modules to reduce the time it takes to isolate faulty chips. Both the test time and the power overhead are better with the testing-switch implementation than with schemes using built-in logic block observer circuits. The proposed technique is especially useful when boundary scan and self-test cannot be implemented in every chip of a board.<>
Keywords :
automatic testing; logic testing; block observer circuits; broad-level implementation; built-in test module; fault isolation; power overhead; signature analysis; testing switch; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Feedback; Integrated circuit testing; Logic circuits; Logic testing; Switches; Test pattern generators;
Journal_Title :
Design & Test of Computers, IEEE
