DocumentCode :
1178915
Title :
Lower Limits of Discrete Universal Denoising
Author :
Viswanathan, Krishnamurthy ; Ordentlich, Erik
Author_Institution :
Hewlett-Packard Labs., Palo Alto, CA
Volume :
55
Issue :
3
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
1374
Lastpage :
1386
Abstract :
In the spirit of results on universal compression, we compare the performance of universal denoisers on discrete memoryless channels to that of the best performance obtained by an omniscient kth-order sliding-window denoiser, namely, one that is tuned to the transmitted noiseless sequence. We show that the additional loss incurred in the worst case by any universal denoiser on a length- n sequence grows at least like Omega(ck/radicn) , where c is a constant depending on the channel parameters and the loss function. This shows that for fixed k the additional loss incurred by the Discrete Universal Denoiser (DUDE) is no larger than a constant multiplicative factor of the best possible. Furthermore, we compare universal denoisers to denoisers that are aware of the distribution of the transmitted noiseless sequence. We show that, even for this weaker target loss, for any universal denoiser there exists some distribution for the noiseless sequence corresponding to a sequence of independent and identically distributed (i.i.d.) random variables whose optimum expected loss is lower than that incurred by the universal denoiser by Omega(1/radicn).
Keywords :
memoryless systems; random processes; signal denoising; channel parameter; constant multiplicative factor; discrete memoryless channel; discrete universal denoising; distributed random variable; loss function; lower limit; noiseless sequence; omniscient kth-order sliding-window denoiser; Helium; Information theory; Loss measurement; Memoryless systems; Noise reduction; Pattern recognition; Random variables; Statistical learning; Stochastic resonance; Compound Bayes; denoising; lower bounds; regret; universal;
fLanguage :
English
Journal_Title :
Information Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9448
Type :
jour
DOI :
10.1109/TIT.2008.2011429
Filename :
4787609
Link To Document :
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