DocumentCode :
1179725
Title :
Microscopic prediction of optical and electronic material properties in GaInNAs semiconductor lasers
Author :
Hader, J. ; Moloney, J.V. ; Koch, S.W.
Author_Institution :
Center for Math. Sci., Arizona Univ., Tucson, AZ, USA
Volume :
150
Issue :
1
fYear :
2003
fDate :
2/1/2003 12:00:00 AM
Firstpage :
22
Lastpage :
24
Abstract :
A fit-parameter-free model is used to calculate optical and electronic material properties of GaInNAs semiconductor lasers. Incoherent processes which lead to dephasing of optical polarisations and carrier thermalisation are calculated microscopically by solving generalised quantum-Boltzmann equations for electron-electron and electron-phonon scattering. The theory is shown to give excellent quantitative agreement with experimental results. Shortcomings of simpler approaches are demonstrated. Carrier capture times in GaInNAs systems of varying well depth and width are calculated and the results are compared to those in InGaPAs- and AlInGaAs-based structures.
Keywords :
Boltzmann equation; III-V semiconductors; carrier lifetime; electron-electron scattering; electron-phonon interactions; gallium arsenide; indium compounds; laser theory; light polarisation; quantum well lasers; semiconductor device models; AlInGaAs; GaInNAs; GaInNAs semiconductor lasers; InGaPAs; QW lasers; carrier capture times; carrier thermalisation; electron-electron scattering; electron-phonon scattering; electronic material properties; fit-parameter-free model; generalised quantum Boltzmann equations; incoherent processes; microscopic prediction; optical polarisations; optical properties; well depth; well width;
fLanguage :
English
Journal_Title :
Optoelectronics, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2433
Type :
jour
DOI :
10.1049/ip-opt:20030031
Filename :
1193687
Link To Document :
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