• DocumentCode
    1180159
  • Title

    Loss reduction in InGaAs/InGaAlAs quantum well electron transfer waveguides using ion implantation

  • Author

    Zucker, J.E. ; Divine, M.D. ; Chang, T.Y. ; Sauer, N.J.

  • Author_Institution
    AT&T Bell Labs., Holmdel, NJ, USA
  • Volume
    6
  • Issue
    9
  • fYear
    1994
  • Firstpage
    1105
  • Lastpage
    1108
  • Abstract
    We demonstrate that phosphorous ion implantation is an effective means of blue-shifting the absorption edge in InGaAs/InGaAlAs barrier, reservoir and quantum well electron transfer structures (BRAQWETS). The electroabsorption peak is wavelength-shifted by 100 nm after implant, with a complete recovery of the electroabsorption magnitude after an appropriate rapid thermal anneal cycle. Good electrical characteristics are also maintained after implant and anneal. We apply this technique to loss reduction for BRAQWETS waveguide devices. At 1.523 mm, the implant and anneal results in a decrease of rib waveguide propagation loss from 79.4 dB/mm to 6.2 dB/mm.<>
  • Keywords
    III-V semiconductors; electro-optical devices; electroabsorption; gallium arsenide; indium compounds; integrated optics; ion implantation; optical losses; optical modulation; optical waveguides; semiconductor quantum wells; 1.523 nm; BRAQWETS; BRAQWETS waveguide devices; InGaAs-InGaAlAs; InGaAs/InGaAlAs quantum well electron transfer waveguides; absorption edge; barrier/reservoir/quantum well electron transfer structures; blue-shift; electroabsorption magnitude; electroabsorption peak; good electrical characteristics; ion implantation; loss reduction; phosphorous ion implantation; rapid thermal anneal cycle; rib waveguide propagation loss; wavelength-shifted; Absorption; Electric variables; Electrons; Implants; Indium gallium arsenide; Ion implantation; Optical waveguides; Rapid thermal annealing; Reservoirs; Substrates;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.324682
  • Filename
    324682