Characterization of the perturbation effect of a probe head using the FD-TD method

Author

Qian, Yongxi ; Iwata, Shin-ichirou ; Yamashita, Eikichi

Author_Institution

Univ. of Electro-Commun., Tokyo, Japan

Volume

4

Issue

10

fYear

1994

Firstpage

317

Lastpage

319

Abstract

The perturbation effect of a probe head in microwave measurement is investigated by using the FD-TD method. A two-simulation approach with improved accuracy is employed to predict the insertion loss caused by the probe head. Depending on the diameter and reclining angle of the probe head, a maximum insertion loss of up to 0.8 dB has been calculated for an example structure. This work provides a rigorous and quantitative estimation of the probe effect. The analysis results may also serve as a guidance for optimal designing and positioning of probe heads so that a minimum field perturbation during measurement can be expected.<>

Keywords

finite difference time-domain analysis; microwave measurement; probes; 0.8 dB; FD-TD method; diameter; field perturbation; insertion loss; microwave measurement; optimal designing; optimal positioning; probe head; reclining angle; two-simulation; Circuit testing; Conductors; Frequency; Insertion loss; Microstrip; Microwave devices; Microwave measurements; Microwave theory and techniques; Position measurement; Probes;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.324702

Filename

324702