• DocumentCode
    1181155
  • Title

    3-D Technology Assessment: Path-Finding the Technology/Design Sweet-Spot

  • Author

    Marchal, Paul ; Bougard, Bruno ; Katti, Guruprasad ; Stucchi, Associate Michele ; Dehaene, Wim ; Papanikolaou, Antonis ; Verkest, Diederik ; Swinnen, Bart ; Beyne, Eric

  • Author_Institution
    IMEC VZW, Leuven
  • Volume
    97
  • Issue
    1
  • fYear
    2009
  • Firstpage
    96
  • Lastpage
    107
  • Abstract
    It is widely acknowledged that three-dimensional (3-D) technologies offer numerous opportunities for system design. In recent years, significant progress has been made on these 3-D technologies, and they have become probably the best hope for carrying the semiconductor industry beyond the path of Moore´s law. However, a clear roadmap is missing to successfully introduce this 3-D technology onto the market. Today, a plurality of 3-D technology options exists, which requires different design and test strategies. To crystallize the many technology options in a few mainstream technologies, it is mandatory to coexplore both technology and design options. The contribution of this paper is to introduce a novel path finding methodology to untangle the many intertwined design/technology options. This holistic approach will be applied on a representative 3-D case study. Initial results demonstrate the benefits of the proposed path-finding methodology to steer the technology development and fine-tune design strategies.
  • Keywords
    circuit CAD; integrated circuit design; semiconductor industry; 3D technology assessment; path-finding; semiconductor industry; system design; Costs; Crystallization; Electronics industry; Foundries; Integrated circuit interconnections; Integrated circuit technology; Logic testing; Moore´s Law; Silicon carbide; Space technology; Design automation; design centering; integrated circuit design; technology assessment;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2008.2007471
  • Filename
    4796274