• DocumentCode
    1181696
  • Title

    Analysis on the effects of fiber end face scratches on return loss performance of optical fiber connectors

  • Author

    He, Zuyuan ; Mahmood, Waqar ; Sahinci, Erin ; Ahmad, Nasir ; Pradieu, Yves

  • Author_Institution
    CIENA Corp., Linthicum, MD, USA
  • Volume
    22
  • Issue
    12
  • fYear
    2004
  • Firstpage
    2749
  • Lastpage
    2754
  • Abstract
    This paper introduces a novel model for analyzing the optical interface performance degradation due to scratches on optical fiber end face. The model indicates that the contribution to the return loss (RL) of a scratch is determined by its size, location, and its relative reflectivity, which is defined as the ratio of the average reflectivity of the scratch to the base reflectivity of the defectless end face. Based on this new model, the effects on RL are analyzed for scratches of various numbers, different sizes, with different relative reflectivities, and at different locations. This quantified analysis provides a solid base to establish the specifications of inspection criteria of optical fiber connectors. With the new model, the relative reflectivity of a scratch was tested, and estimations of the RL of scratched connectors were performed, which were in good agreement with measurement results.
  • Keywords
    optical fibre losses; optical fibre testing; optical interconnections; reflectivity; fiber end face scratches; inspection criteria; optical fiber connector; optical fiber measurement; optical interface performance degradation; reflectivity; return loss performance; scratched connectors; Connectors; Degradation; Inspection; Optical fiber losses; Optical fibers; Optical losses; Performance analysis; Performance loss; Reflectivity; Solids; Optical fiber connectors; optical fiber interface; optical fiber measurement; optical reflection; scattering by rough surface;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2004.834485
  • Filename
    1366474