Title :
Loss distribution measurement of silica-based waveguides by using a jaggedness-free optical low coherence reflectometer
Author :
Takada, Ryoki ; Yamada, Hiroyoshi ; Horiguchi, M.
Author_Institution :
NTT Opto-Electron. Labs., Ibaraki
fDate :
8/18/1994 12:00:00 AM
Abstract :
The loss distributions in silica-based waveguides are successfully measured using a jaggedness-free optical reflectometer (OLCR). The OLCR reduces jagged fluctuations which appear in Rayleigh backscattering measurements undertaken with conventional OLCRs to within ±1 dB by averaging the wavelength-dependent Rayleigh backscatter signals. Constant loss distributions and a step-like loss increase in the waveguides were clearly observed
Keywords :
Rayleigh scattering; optical loss measurement; optical losses; optical waveguides; reflectometry; silicon compounds; Rayleigh backscattering measurements; jaggedness-free optical low coherence reflectometer; loss distribution measurement; silica-based waveguides; step-like loss increase; wavelength-dependent Rayleigh backscatter signals;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940986
