مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1182066

Title :

Editorial

Author :

Bedrosian, S.

Volume :

Issue :

fYear :

1979

fDate :

7/1/1979 12:00:00 AM

Firstpage :

409

Lastpage :

410

Keywords :

Analog integrated circuits; Automatic testing; Fault diagnosis; Integrated circuit testing; Integrated circuits, analog; Special issues;

fLanguage :

English

Journal_Title :

Circuits and Systems, IEEE Transactions on

Publisher :

ieee

ISSN :

0098-4094

Type :

jour

DOI :

10.1109/TCS.1979.1084654

Filename :

1084654

Link To Document :