DocumentCode :
1182114
Title :
Fault diagnosis for linear systems via multifrequency measurements
Author :
Sen, Neeraj ; Saeks, Richard
Volume :
26
Issue :
7
fYear :
1979
fDate :
7/1/1979 12:00:00 AM
Firstpage :
457
Lastpage :
465
Abstract :
The fault diagnosis problem for a linear system whose transfer function matrix is measured at a discrete set of frequencies is formalized. A measure of solvability for the resultant equations and a measure of testability for the unit under test is developed. These, in turn, are used as the basis of algorithms for choosing test points and test frequencies.
Keywords :
Analog integrated circuits; Deterministic; Fault diagnosis; Integrated circuit testing; Integrated circuits, analog; Analog circuits; Circuit faults; Circuit synthesis; Circuit testing; Computer networks; Electrical engineering; Fault diagnosis; Helium; Linear systems; Physics;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1979.1084659
Filename :
1084659
Link To Document :
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