Title :
Fault diagnosis for linear systems via multifrequency measurements
Author :
Sen, Neeraj ; Saeks, Richard
fDate :
7/1/1979 12:00:00 AM
Abstract :
The fault diagnosis problem for a linear system whose transfer function matrix is measured at a discrete set of frequencies is formalized. A measure of solvability for the resultant equations and a measure of testability for the unit under test is developed. These, in turn, are used as the basis of algorithms for choosing test points and test frequencies.
Keywords :
Analog integrated circuits; Deterministic; Fault diagnosis; Integrated circuit testing; Integrated circuits, analog; Analog circuits; Circuit faults; Circuit synthesis; Circuit testing; Computer networks; Electrical engineering; Fault diagnosis; Helium; Linear systems; Physics;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1979.1084659