DocumentCode
1182215
Title
Fault isolation algorithm for analog electronic systems using the fuzzy concept
Author
Lee, Jonghee ; Bedrosian, Samuel D.
Volume
26
Issue
7
fYear
1979
fDate
7/1/1979 12:00:00 AM
Firstpage
518
Lastpage
522
Abstract
We are mainly concerned with enhancing ATPG for analog nonlinear circuits. For simplicity we are dealing only with the isolation of single fault cases. Due to the imprecision and indeterminacy of the complex structure of faulty networks, it is usually difficult to obtain exact solutions. Furthermore, for fault isolation it is often unnecessary to seek the exact solutions. In fact we find it useful to treat such faulty networks as fuzzy systems. The algorithm presented herein makes use of the available measured data on port responses to isolate the faulty components based on fuzzy set concepts. An illustrative example using the NAP2 network analysis program is included. These results aie compared with previous results based on other criteria.
Keywords
Analog integrated circuits; Automatic testing; Fault diagnosis; Fuzzy set theory; Integrated circuit testing; Integrated circuits, analog; Nondeterministic; Nonlinear networks; Automatic test pattern generation; Circuit faults; Entropy; Fuzzy set theory; Fuzzy sets; Fuzzy systems; Helium; Ice; Probability; Working environment noise;
fLanguage
English
Journal_Title
Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0098-4094
Type
jour
DOI
10.1109/TCS.1979.1084669
Filename
1084669
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