• DocumentCode
    1182215
  • Title

    Fault isolation algorithm for analog electronic systems using the fuzzy concept

  • Author

    Lee, Jonghee ; Bedrosian, Samuel D.

  • Volume
    26
  • Issue
    7
  • fYear
    1979
  • fDate
    7/1/1979 12:00:00 AM
  • Firstpage
    518
  • Lastpage
    522
  • Abstract
    We are mainly concerned with enhancing ATPG for analog nonlinear circuits. For simplicity we are dealing only with the isolation of single fault cases. Due to the imprecision and indeterminacy of the complex structure of faulty networks, it is usually difficult to obtain exact solutions. Furthermore, for fault isolation it is often unnecessary to seek the exact solutions. In fact we find it useful to treat such faulty networks as fuzzy systems. The algorithm presented herein makes use of the available measured data on port responses to isolate the faulty components based on fuzzy set concepts. An illustrative example using the NAP2 network analysis program is included. These results aie compared with previous results based on other criteria.
  • Keywords
    Analog integrated circuits; Automatic testing; Fault diagnosis; Fuzzy set theory; Integrated circuit testing; Integrated circuits, analog; Nondeterministic; Nonlinear networks; Automatic test pattern generation; Circuit faults; Entropy; Fuzzy set theory; Fuzzy sets; Fuzzy systems; Helium; Ice; Probability; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1979.1084669
  • Filename
    1084669