DocumentCode :
1182286
Title :
Optical Analysis of Phosphor´s Location for High-Power Light-Emitting Diodes
Author :
Liu, Zongyuan ; Liu, Sheng ; Wang, Kai ; Luo, Xiaobing
Author_Institution :
Sch. of Mech. Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan
Volume :
9
Issue :
1
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
65
Lastpage :
73
Abstract :
High-power-light-emitting-diode (LED) packaging is crucial for the development of solid-state lighting. Phosphor´s location could affect the LED packaging performance such as light extraction and correlated color temperature (CCT). This paper systematically analyzes first the effects of phosphor´s location on LED packaging performance. A two-light-source step computation method based on the Monte Carlo theory is developed, and five different optical structures are discussed. Results show that the location of phosphor has small impact on light extraction but could greatly affect CCT. Remote phosphor location presents higher light extraction than proximate phosphor location. However, the increase is slight, and too remote location could reduce light extraction. A convex phosphor layer has higher light extraction but lower yellow-blue ratio than a plane phosphor layer. Considering the significant variation of CCT, it is suggested that an optical structure with plane and remote phosphor location should be a suitable choice for LED packaging.
Keywords :
Monte Carlo methods; light emitting diodes; phosphors; semiconductor device packaging; LED lights; LED packaging; Monte Carlo theory; high-power light-emitting diodes; light extraction; phosphor; solid-state lighting; two-light-source step computation method; yellow-blue ratio; Laboratories; Light emitting diodes; Monte Carlo methods; Optical computing; Packaging; Performance analysis; Phosphors; Power engineering and energy; Solid state lighting; Temperature; Correlated color temperature (CCT); light extraction; light-emitting diodes (LEDs); packaging; phosphor;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2008.2010250
Filename :
4796377
Link To Document :
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