Title :
Third-order intermodulation measurements of microstrip bandpass filters based on high-temperature superconductors
Author :
Sato, Hisashi ; Kurian, Jose ; Naito, Michio
Author_Institution :
Basic Res. Labs., Nippon Telegraph & Telephone Corp., Kanagawa, Japan
Abstract :
The insufficient power-handling capability of high-temperature superconducting microwave filters has been a serious barrier to their application. To clarify the key parameters for improving the power-handling capability of RF filters based on high-temperature superconductors (HTSs) with microstrip structures, we synthesized bandpass filters with different layouts using several kinds of HTS thin films and performed third-order intermodulation measurements on them. The experimental results indicate that increasing the film thickness and utilizing molecular-beam-epitaxy-grown films of NdBa2Cu3O7 (NBCO) are effective in obtaining microstrip filters with high power-handling capability. For NBCO filters, we also investigated the effects of oxygen annealing, passband width, and the frequencies of the input signals on the power-handling capability.
Keywords :
annealing; band-pass filters; barium compounds; high-temperature superconductors; intermodulation distortion; microstrip filters; microwave filters; neodymium compounds; passive filters; superconducting epitaxial layers; superconducting filters; superconducting microwave devices; HTS thin films; NdBa2Cu3O7; RF filters; high-temperature superconductors; microstrip bandpass filters; microstrip structures; microwave filters; molecular beam epitaxy grown films; oxygen annealing; passive filters; power handling capability; power-handling capability; third order intermodulation measurement; Band pass filters; High temperature superconductors; Microstrip filters; Microwave filters; Performance evaluation; Radio frequency; Superconducting films; Superconducting filters; Superconducting microwave devices; Superconducting thin films; Bandpass filters; high-temperature superconductors (HTSs); intermodulation distortion; microstrip; thin films;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2004.837312