Title :
Controllability/observability analysis of digital circuits
Author :
Goldstein, Lawrence H.
fDate :
9/1/1979 12:00:00 AM
Abstract :
The testability of a digital circuit is directly related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper presents a method for analyzing digital circuits in terms of six functions which characterize combinational and sequential controllability and observability.
Keywords :
Combinational circuit fault diagnosis; Controllability; Logic circuit fault diagnosis; Observability; Sequential machine fault diagnosis; Circuit analysis; Circuit testing; Controllability; Digital circuits; Large scale integration; Logic testing; Observability; Sequential analysis; Software libraries; System testing;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1979.1084687
