DocumentCode
1182396
Title
Controllability/observability analysis of digital circuits
Author
Goldstein, Lawrence H.
Volume
26
Issue
9
fYear
1979
fDate
9/1/1979 12:00:00 AM
Firstpage
685
Lastpage
693
Abstract
The testability of a digital circuit is directly related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper presents a method for analyzing digital circuits in terms of six functions which characterize combinational and sequential controllability and observability.
Keywords
Combinational circuit fault diagnosis; Controllability; Logic circuit fault diagnosis; Observability; Sequential machine fault diagnosis; Circuit analysis; Circuit testing; Controllability; Digital circuits; Large scale integration; Logic testing; Observability; Sequential analysis; Software libraries; System testing;
fLanguage
English
Journal_Title
Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0098-4094
Type
jour
DOI
10.1109/TCS.1979.1084687
Filename
1084687
Link To Document