A new design approach for low phase-noise reflection-type MMIC oscillators

Author

Lenk, Friedrich ; Schott, Matthias ; Hilsenbeck, Jochen ; Heinrich, Wolfgang

Author_Institution

Ferdinand-Braun-Inst. fur Hochsfrequenstech., Berlin, Germany

Volume

52

Issue

12

fYear

2004

Firstpage

2725

Lastpage

2731

Abstract

In this paper, optimization of the loaded quality factor Q_L for reflection-type heterojunction bipolar transistor (HBT) oscillators is investigated. The main result is an optimum relation between the S-parameter phases at the three transistor ports. A new design strategy for this type of oscillator is proposed. The analysis is verified by comparing several Ka-band monolithic-microwave integrated-circuit oscillators in GaAs HBT technology with different resonators. The measured loaded Q_L values correspond to the measured phase noise of the circuits. At an oscillation frequency of 33 GHz, an excellent phase noise of -87 dBc/Hz at 100-kHz offset frequency is achieved over the whole tuning range.

Keywords

III-V semiconductors; MMIC oscillators; Q-factor; S-parameters; bipolar MMIC; circuit optimisation; circuit tuning; gallium arsenide; integrated circuit design; integrated circuit noise; phase noise; 100 kHz; 33 GHz; GaAs; HBT technology; Ka-band MMIC oscillators; S-parameters; circuit optimization; circuit tuning; heterojunction bipolar transistor oscillators; integrated circuit design; low phase noise MMIC oscillators; monolithic microwave integrated circuit oscillators; quality factor; reflection type HBT oscillators; reflection type MMIC oscillators; resonators; transistor ports; Frequency; Heterojunction bipolar transistors; Integrated circuit measurements; MMICs; Noise measurement; Oscillators; Phase measurement; Phase noise; Q factor; Q measurement; Heterojunction bipolar transistors (HBTs); microwave oscillators; monolithic-microwave integrated-circuit (MMIC) oscillators; quality (; voltage-controlled oscillators (VCOs);

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/TMTT.2004.837319

Filename

1366545