Title :
Novel 1-out-of-n CMOS checker
Author :
Metra, C. ; Favalli, Michele ; Ricco, Bruno
Author_Institution :
Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ.
fDate :
8/18/1994 12:00:00 AM
Abstract :
An original concept is presented to implement highly testable and compact 1-out-of-n checkers (for any value of n), that are totally self-checking with respect to a wide set of realistic faults (including resistive bridgings). The case of n=3 is explicitly treated as a significant example
Keywords :
CMOS integrated circuits; built-in self test; fault location; integrated circuit testing; 1-out-of-n CMOS checker; faults; resistive bridgings; totally self-checking;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940967
