A translinear RMS detector for embedded test of RF ICs

Author

Yin, Qizhang ; Eisenstadt, William R. ; Fox, Robert M. ; Zhang, Tao

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA

Volume

54

Issue

5

fYear

2005

Firstpage

1708

Lastpage

1714

Abstract

This paper presents a wide-bandwidth, high dynamic range, BiCMOS RF rms detector based on the dynamic translinear principle. A current-domain circuit carries out the main computation, and a circuit compensates for errors due to finite transistor gain. Wide-bandwidth input and output circuits allow connecting voltage-mode signals to the internal current-mode circuitry. Measurements on a prototype chip demonstrate that the circuit is suitable for embedded on-chip testing, particularly for "alternative test" of RF circuits.

Keywords

BiCMOS integrated circuits; current-mode circuits; detector circuits; error compensation; integrated circuit testing; radiofrequency integrated circuits; BiCMOS RF detector; RF IC; RF circuit; current-domain circuit; embedded on-chip testing; embedded test; integrated circuit; internal current-mode circuit; root mean square detector; transistor gain; translinear RMS detector; voltage-mode signal; wide-bandwidth input circuit; wide-bandwidth output circuit; BiCMOS integrated circuits; Circuit testing; Detectors; Dynamic range; Joining processes; Particle measurements; Prototypes; Radio frequency; Semiconductor device measurement; Voltage; Analog; detector; embedded; integrated circuit (IC); radio frequency (RF); root mean square (rms); test;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2005.855105

Filename

1514619