Embedded loopback test for RF ICs

Author

Yoon, Jang-Sup ; Eisenstadt, William R.

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA

Volume

54

Issue

5

fYear

2005

Firstpage

1715

Lastpage

1720

Abstract

This paper explores the use of on-chip or on-wafer loopback implementations for verifying performance of 5-GHz wireless local area network (WLAN) IC circuits. The loopback test diagram, the test-circuit design, and the characterization data are reported for subcircuits (attenuators, and switches) necessary to implement 5-GHz transceiver loopback. A loopback circuit that can be applied to transceiver loopback measurements is demonstrated. This research is exploratory in nature and is a first attempt at a new on-chip RF test technique.

Keywords

embedded systems; integrated circuit testing; radiofrequency integrated circuits; transceivers; wireless LAN; 5 GHz; RF IC; WLAN IC; attenuator; loopback circuit; loopback test diagram; on-chip RF test; on-chip loopback implementation; on-wafer loopback implementation; switch; test-circuit design; transceiver loopback; wireless local area network IC; Automatic testing; Circuit testing; Network-on-a-chip; RF signals; Radio frequency; Switches; System testing; Transceivers; Transmitters; Wireless LAN; Loopback; measurements; on-chip; radio frequancy (RF); test; transceiver; wireless local area network (WLAN);

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2005.855091

Filename

1514620