Title : 
A methodology to perform online self-testing for field-programmable analog array circuits
         
        
            Author : 
Laknaur, Amit ; Wang, Haibo
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
         
        
        
        
        
        
        
            Abstract : 
This paper presents a methodology to perform online self-testing for analog circuits implemented on field-programmable analog arrays (FPAAs). It proposes to partition the FPAA circuit under test into subcircuits. Each subcircuit is tested by replicating the subcircuit with programmable resources on the FPAA chip, and comparing the outputs of the subcircuit and its replication. To effectively implement the proposed methodology, this paper proposes a simple circuit partition method and develops techniques to address circuit stability problems that are often encountered in the proposed testing method. Furthermore, error sources in the proposed testing circuit are studied and methods to improve the accuracy of testing results are presented. Finally, experimental results are presented to demonstrate the validity of the proposed methodology.
         
        
            Keywords : 
built-in self test; circuit stability; field programmable analogue arrays; integrated circuit testing; BIST; FPAA circuit; analog circuit; analog online testing; built-in-self-testing; circuit partition method; circuit stability; field-programmable analog array circuit; online self-testing; programmable resources; Analog circuits; Built-in self-test; Circuit faults; Circuit stability; Circuit testing; Current measurement; Field programmable analog arrays; Field programmable gate arrays; Filtering; Hardware; Analog online testing; built-in-self-testing (BIST); field-programmable analog array (FPAA);
         
        
        
            Journal_Title : 
Instrumentation and Measurement, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TIM.2005.855096