• DocumentCode
    1182605
  • Title

    Interfacial microstructure and withstand voltage of polyethylene for power cables

  • Author

    Gao, L.Y. ; Guo, W.Y. ; Tu, D.M.

  • Author_Institution
    Dept. of Electr. Eng., Tongji Univ., Shanghai, China
  • Volume
    10
  • Issue
    2
  • fYear
    2003
  • fDate
    4/1/2003 12:00:00 AM
  • Firstpage
    233
  • Lastpage
    239
  • Abstract
    In order to increase the electrical breakdown strength and treeing inception voltage of cross-linked polyethylene (XLPE) insulated power cable, surfactant in combination with titanate coupling agent, as an additive, has been mixed with the semiconducting layer, which is surrounded by polyethylene insulation, to chemically improve the dielectric properties of polyethylene interface. By means of infrared and X-ray diffraction spectra analyses, a change in the crystalline orientation angle and the density of polyethylene is observed inside the improved polyethylene interfacial layer. Additionally, it is assumed that a thin diffusion layer is formed, that results in a decrease in the electric field stress on the polyethylene interface and then an increase in the withstand voltage of polyethylene.
  • Keywords
    X-ray diffraction; XLPE insulation; crystal microstructure; dielectric properties; infrared spectra; insulation testing; power cable insulation; power cable testing; X-ray diffraction spectra analysis; XLPE insulated power cable; additive; cross-linked polyethylene; crystalline orientation angle; dielectric properties; infrared analysis; interfacial microstructure; polyethylene; polyethylene density; polyethylene interface; polyethylene interfacial layer; power cables; semiconducting layer; surfactant; thin diffusion layer; titanate coupling agent; withstand voltage; Breakdown voltage; Cable insulation; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Microstructure; Polyethylene; Power cables; Semiconductor device breakdown; Trees - insulation;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2003.1194104
  • Filename
    1194104