DocumentCode :
118272
Title :
Study of silver-copper-palladium solder properties for vacuum electronic devices
Author :
Xiaowei Wang ; Yutian Shu ; Limin Ma ; Fu Guo
Author_Institution :
Coll. of Mater. Sci. & Eng, Beijing Univ. of Technol., Beijing, China
fYear :
2014
fDate :
12-15 Aug. 2014
Firstpage :
167
Lastpage :
171
Abstract :
Silver-Copper-Palladium (Ag-Cu-Pd) brazing alloy is an important material used for vacuum electronic devices packaging for its low vapor pressure, good air tightness, excellent wetting property, and mechanical properties. The Ag-Cu-Pd brazing alloys are proposed for the vacuum electronic devices packaging in these few years. Ag-Cu-Pd alloy is one of the common mid-temperature and high-temperature brazing alloys used in multiple temperature gradients soldering as present. In the current study, three Ag-Cu-Pd brazing alloys with different components were designed for multiple temperature gradient soldering. The Ag-Cu-Pd brazing alloys were prepared by means of vacuum induction melting. In order to obtain thin Ag-Cu-Pd alloy strips, the ingots were melted and injected onto a copper roller rolling at high speed (i.e., melt spinning). The obtained thin strips were used for soldering. The phase constitution, solidliquid phase transition temperatures, microstructures, elemental distribution and wetting property of the Ag-Cu-Pd solder alloys on copper were investigated. Melting behavior of three Ag-Cu-Pd brazing alloys with different components were tested using Differential Scanning Calorimetry, the liquidus were 990°C, 890°C and 846°C. The Ag-Cu-Pd brazing alloys were soldered with copper substrates at different temperatures for different periods of time. The spreading areas for all Ag-Cu-Pd brazing alloys on copper were in the range of 220-460 mm2, the wetting angles were in the range of 12-24°, which indicate the good wettability of Ag-Cu-Pd alloys on copper. The Cu/Ag-Cu-Pd solder joints were examined with Scanning Electron Microscope and Electron Dispersive X-ray analysis. In this study, the proper vacuum electronic devices brazing components and optimal brazing parameters are obtained, which could be potentially applied for practical applications.
Keywords :
copper alloys; electronics packaging; melting; palladium alloys; silver alloys; solders; vacuum microelectronics; Ag-Cu-Pd; brazing alloy; differential scanning calorimetry; electron dispersive x-ray analysis; scanning electron microscope; solder properties; solidliquid phase transition temperature; temperature 846 C; temperature 890 C; temperature 990 C; temperature gradients soldering; vacuum electronic devices packaging; vacuum induction melting; Copper; Joints; Microstructure; Soldering; Substrates; Welding; Ag-Cu-Pd brazing alloyr; Electrical Vacuum devices; Microstructure and Property; wettability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
Type :
conf
DOI :
10.1109/ICEPT.2014.6922629
Filename :
6922629
Link To Document :
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