DocumentCode
1182764
Title
A new technique for thermal resistance measurement in power electron devices
Author
Filicori, Fabio ; Rinaldi, Paola ; Vannini, Giorgio ; Santarelli, Alberto
Author_Institution
Dept. of Electron., Univ. of Bologna, Italy
Volume
54
Issue
5
fYear
2005
Firstpage
1921
Lastpage
1925
Abstract
A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided.
Keywords
power semiconductor devices; semiconductor device testing; thermal resistance measurement; electrical characterization; power electron devices; special-purpose instrumentation; standard measurements; temperature-dependent electrical device models; thermal resistance measurement; Calibration; Electric resistance; Electric variables measurement; Electrical resistance measurement; Electron devices; Power measurement; Pulse measurements; Temperature sensors; Thermal resistance; Voltage; Device characterization; electron device; thermal resistance;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2005.854247
Filename
1514644
Link To Document