Title :
A new technique for thermal resistance measurement in power electron devices
Author :
Filicori, Fabio ; Rinaldi, Paola ; Vannini, Giorgio ; Santarelli, Alberto
Author_Institution :
Dept. of Electron., Univ. of Bologna, Italy
Abstract :
A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided.
Keywords :
power semiconductor devices; semiconductor device testing; thermal resistance measurement; electrical characterization; power electron devices; special-purpose instrumentation; standard measurements; temperature-dependent electrical device models; thermal resistance measurement; Calibration; Electric resistance; Electric variables measurement; Electrical resistance measurement; Electron devices; Power measurement; Pulse measurements; Temperature sensors; Thermal resistance; Voltage; Device characterization; electron device; thermal resistance;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.854247
