DocumentCode :
118290
Title :
The finite element analysis of solder joints under temperature cycling
Author :
Fangyi Liu ; Wenzhong Lou ; Fufu Wang ; Xuran Ding ; Dakui Wang
Author_Institution :
Sch. of Mechatronical Eng., Beijing Inst. of Technol., Beijing, China
fYear :
2014
fDate :
12-15 Aug. 2014
Firstpage :
214
Lastpage :
218
Abstract :
A thermal-mechanical coupled finite element analysis model of solder joints is established, which plays a role in mechanical support and electrical connection in flip chip. Periodic temperature cycle load (-45°C~125°C) applied on the solder joints and it will generate periodic internal stress and strain in the process of the temperature cycling. With repeat using, the solder joints will produce deformation, and then cracks, extension, interlayer delaminating. The failure of the solder joints may cause the failure of the entire switch. This paper aims to simulate the periodic changes in temperature and obtain the reliability and potential failure modes of solder joints under temperature cycling, thus providing theory reference for the design and application of the novel solid MEMS switch.
Keywords :
failure analysis; finite element analysis; flip-chip devices; microswitches; solders; MEMS switch; electrical connection; failure modes; flip chip; periodic internal stress; solder joints failure; temperature cycling; thermal-mechanical coupled finite element analysis model; Analytical models; Finite element analysis; Flip-chip devices; Soldering; Strain; Stress; Thermal stresses; FEM; delamination; flip-chip; solder joint; temperature cycling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
Type :
conf
DOI :
10.1109/ICEPT.2014.6922639
Filename :
6922639
Link To Document :
بازگشت