• DocumentCode
    118294
  • Title

    Research on conformal EMI shielding Cu/Ni layers on package

  • Author

    Fankun Jiang ; Ming Li ; Liming Gao

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    227
  • Lastpage
    230
  • Abstract
    Electromagnetic noise caused by high speed digital and radio frequency electronic devices can affect the normal operation of other devices within the same system and result in significant intra-system electromagnetic interference (EMI) problems. Conformal shielding is an emerging method to prevent EMI by using metallization techniques to coat a thin metal layer around the package. In this study, copper is used as the main shielding material due to its excellent conductivity and low price. A nickel layer is plated over copper to protect the oxidation of copper. We focus on the effect of electroless plating process on adhesion and the influence of Cu/Ni thickness on shielding effectiveness. As a result, swelling for 15 minutes and etching for 5 minutes can lead to best adhesion. When copper thickness increases, shielding effectiveness first increases and then remains at a certain level. Changing nickel thickness has very little impact on shielding effectiveness.
  • Keywords
    adhesion; copper; electromagnetic interference; electromagnetic shielding; electroplating; etching; metallisation; nickel; system-in-package; Cu-Ni; conformal EMI shielding; electroless plating; electromagnetic interference; electromagnetic noise; etching; metallization; shielding effectiveness; thin metal layer; time 15 min; time 5 min; Adhesives; Copper; Electromagnetic interference; Materials; Nickel; Reflection; adhesion; conformal shielding; electroless plating; electromagnetic interference; shielding effectiveness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922642
  • Filename
    6922642