• DocumentCode
    1183134
  • Title

    Structural defects characterisation of GaInNAs MQWs by TEM and PL

  • Author

    Herrera, M. ; González, D. ; Garcia, R. ; Hopkinson, M. ; Navaretti, P. ; Gutiérrez, M. ; Liu, H.Y.

  • Author_Institution
    Dept. de Ciencia de los Mater., Univ. de Cadiz, Spain
  • Volume
    151
  • Issue
    5
  • fYear
    2004
  • Firstpage
    385
  • Lastpage
    388
  • Abstract
    The authors´ work is focused on the structural and optical properties of GaInNAs/GaAs(001) QWs with In and N contents in the ranges 0.20-0.35 and 0.013-0.023, respectively, studied by transmission electron microscopy and photoluminescence. An undulation of the wells was observed when increasing the In content to 25% and the N content to 1.6%. This induces the appearance of extrinsic Frank dislocation loops, which are most likely formed because of local stress accumulation in the structure. The PL spectra show intense peaks at 1.1 μm and 1.2 μm for samples with In compositions of 20% and 25%, respectively, representing therefore structures with and without loops. Consequently, the existence of these structural defects seems not to affect the optical efficiency of this alloy. On increasing the In content to 35%, a considerable decrease in the PL peak intensity, related to the existence of threading dislocations observed by TEM, has been found. The unfaulting of dislocation loops by means of the reaction with two Shockley partial dislocations is proposed as the mechanism of formation of these threading dislocations.
  • Keywords
    III-V semiconductors; dislocation loops; gallium arsenide; gallium compounds; indium compounds; internal stresses; photoluminescence; semiconductor quantum wells; transmission electron microscopy; 1.1 mum; 1.2 mum; GaInNAs MQW; GaInNAs-GaAs; GaInNAs/GaAs quantum wells; Shockley partial dislocations; TEM; dislocation loops; extrinsic Frank dislocation loops; local stress accumulation; optical efficiency; optical properties; photoluminescence; structural defects characterisation; threading dislocations; transmission electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:20040870
  • Filename
    1367392