DocumentCode
1183134
Title
Structural defects characterisation of GaInNAs MQWs by TEM and PL
Author
Herrera, M. ; González, D. ; Garcia, R. ; Hopkinson, M. ; Navaretti, P. ; Gutiérrez, M. ; Liu, H.Y.
Author_Institution
Dept. de Ciencia de los Mater., Univ. de Cadiz, Spain
Volume
151
Issue
5
fYear
2004
Firstpage
385
Lastpage
388
Abstract
The authors´ work is focused on the structural and optical properties of GaInNAs/GaAs(001) QWs with In and N contents in the ranges 0.20-0.35 and 0.013-0.023, respectively, studied by transmission electron microscopy and photoluminescence. An undulation of the wells was observed when increasing the In content to 25% and the N content to 1.6%. This induces the appearance of extrinsic Frank dislocation loops, which are most likely formed because of local stress accumulation in the structure. The PL spectra show intense peaks at 1.1 μm and 1.2 μm for samples with In compositions of 20% and 25%, respectively, representing therefore structures with and without loops. Consequently, the existence of these structural defects seems not to affect the optical efficiency of this alloy. On increasing the In content to 35%, a considerable decrease in the PL peak intensity, related to the existence of threading dislocations observed by TEM, has been found. The unfaulting of dislocation loops by means of the reaction with two Shockley partial dislocations is proposed as the mechanism of formation of these threading dislocations.
Keywords
III-V semiconductors; dislocation loops; gallium arsenide; gallium compounds; indium compounds; internal stresses; photoluminescence; semiconductor quantum wells; transmission electron microscopy; 1.1 mum; 1.2 mum; GaInNAs MQW; GaInNAs-GaAs; GaInNAs/GaAs quantum wells; Shockley partial dislocations; TEM; dislocation loops; extrinsic Frank dislocation loops; local stress accumulation; optical efficiency; optical properties; photoluminescence; structural defects characterisation; threading dislocations; transmission electron microscopy;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:20040870
Filename
1367392
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