DocumentCode :
1183257
Title :
Failure-mechanism models for conductive-filament formation
Author :
Rudra, Balu ; Jennings, David
Author_Institution :
Delco Electron. Corp., Kokomo, IN, USA
Volume :
43
Issue :
3
fYear :
1994
fDate :
9/1/1994 12:00:00 AM
Firstpage :
354
Lastpage :
360
Abstract :
This tutorial illustrates design and qualification situations where conductive filament formation, a failure mechanism that can occur in laminates, can affect product performance. Empirical models to design against this failure mechanism are presented in this paper. Examples illustrate the use of these models for design and qualification tests in electronic packaging
Keywords :
failure analysis; laminates; packaging; reliability theory; conductive-filament formation; design tests; electronic packaging; failure-mechanism models; laminates; product performance; qualification tests; Creep; Design engineering; Electromigration; Electronics packaging; Failure analysis; Laminates; Qualifications; Reliability engineering; Silver; Wiring;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.326425
Filename :
326425
Link To Document :
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