Yield optimization for arbitrary statistical distributions: Part II-Implementation

A suggested test problem for proposed algorithms in yield optimization is described in detail. The problem is a current switch emitter follower (CSEF) circuit originally described by Ho, which includes a transmission line. The ideas presented in Part I of this paper [1] are applied to this circuit in order to obtain an optimal statistical design. Production yield is maximized taking into consideration statistical distributions of circuit parameters and realistic correlations between transistor model parameters. Nonlinear programming employing the analytical formuias for yield and its sensitivities is used to provide optimal nominal values for the circuit parameters. Different design specifications are assumed and corresponding optimal designs are obtained.