DocumentCode :
1183636
Title :
Study of electron tunnelling through thin polymer films using a mercury probe technique
Author :
Nabok, A.V. ; Massey, J. ; Buttle, S. ; Ray, A.K.
Author_Institution :
Sch. of Eng., Sheffield Hallam Univ., UK
Volume :
151
Issue :
5
fYear :
2004
Firstpage :
461
Lastpage :
465
Abstract :
A non-destructive technique employing a mercury probe as a counter electrode was successfully developed in order to study the mechanism of charge transport through thin polymer films on silicon and aluminum substrates. The polyelectrolyte self-assembly technique was employed to form the organic films. Both DC and AC current-voltage characteristics were measured at room temperature. An exponential dependence of the tunnelling current on the film thickness was found, and a tunnelling coefficient of 3.3×10-9 m-1 was calculated. The observed voltage dependence was interpreted in terms of the model of a trapezoidal-triangular barrier. The peak in current-voltage characteristics of polymer films on aluminum substrates may be attributed to resonance tunnelling via surface states on the alumina/polymer film interface.
Keywords :
aluminium; charge exchange; mercury (metal); nondestructive testing; polymer films; probes; silicon; substrates; thin films; tunnelling; AC current-voltage; Al; DC current-voltage; Si; alumina/polymer film interface; aluminum substrates; charge transport; counter electrode; current-voltage characteristics; electron tunnelling; film thickness; mercury probe technique; nondestructive technique; organic films; polyelectrolyte self-assembly technique; resonance tunnelling; room temperature; silicon substrates; surface states; thin polymer films; trapezoidal-triangular barrier; tunnelling coefficient; tunnelling current; voltage dependence;
fLanguage :
English
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2409
Type :
jour
DOI :
10.1049/ip-cds:20040994
Filename :
1367445
Link To Document :
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