Title :
High-accuracy circuits for on-chip capacitance ratio testing or sensor readout
Author :
Cao, Yuming ; Temes, Gabor C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
fDate :
9/1/1994 12:00:00 AM
Abstract :
Novel CMOS circuits are described for the on-chip measurement of capacitor ratios. They can provide a high-accuracy A/D interface for capacitive sensors, or allow the precise calibration of switched-capacitor DACs, amplifiers and other circuits utilizing ratioed capacitors. Various structures are proposed and the limitations of their accuracy are analyzed. Computer simulations illustrate the operation and verify the anticipated robustness and high accuracy of the system even in the presence of nonidealities
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; capacitance measurement; digital readout; electric sensing devices; integrated circuit testing; mixed analogue-digital integrated circuits; A/D interface; CMOS circuits; amplifiers; calibration; capacitive sensors; high-accuracy circuits; mixed-mode structures; on-chip capacitance ratio testing; onchip measurement; sensor readout; switched-capacitor DACs; Calibration; Capacitance measurement; Capacitive sensors; Circuit testing; Clocks; Operational amplifiers; Sensor phenomena and characterization; Switched capacitor circuits; Switching circuits; Voltage;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
