Characterization of the dynamics of semiconductor lasers using optical modulation

Author

Su, C.B. ; Eom, J. ; Lange, C.H. ; Kim, C.B. ; Lauer, Robert B. ; Rideout, William C. ; LaCourse, Joanne S.

Author_Institution

Dept. of Electr. Eng.. Texas A&M Univ., College Station, TX, USA

Volume

28

Issue

1

fYear

1992

fDate

1/1/1992 12:00:00 AM

Firstpage

118

Lastpage

127

Abstract

An optical modulation technique for measuring the intrinsic frequency response of semiconductor lasers is described. This technique, which uses an RF-modulated pump laser to create an optical modulation signal to inject into a DC-biased probed laser, offers significant advantages over previous methods such as being affected by electrical parasitics of either the laser to be characterized or the photodetector. The method allows extremely accurate measurements of many important dynamic parameters, including the nonlinear gain coefficients, the amount of spontaneous emission into the guided modes, and the differential carrier lifetime at lasing threshold

Keywords

frequency response; laser modes; laser variables measurement; optical modulation; optical pumping; semiconductor junction lasers; DC-biased probed laser; RF-modulated pump laser; accurate measurements; differential carrier lifetime; diode lasers; dynamic parameters; guided modes; intrinsic frequency response; lasing threshold; nonlinear gain coefficients; nonlinear optics; optical modulation; photodetector; semiconductor lasers; spontaneous emission; Frequency measurement; Frequency response; Gain measurement; Laser excitation; Laser modes; Optical modulation; Photodetectors; Pump lasers; Semiconductor lasers; Ultraviolet sources;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.119504

Filename

119504