• DocumentCode
    1184364
  • Title

    Fast Charging Circuit for NiCd Battery Used in Implant Electronic Systems

  • Author

    Lin, Wen-Chun ; Ko, Wen-Hsiung ; Agrawal, Om P.

  • Author_Institution
    Case Western Reserve University, Cleveland, Ohio 44106.
  • Issue
    4
  • fYear
    1970
  • Firstpage
    331
  • Lastpage
    334
  • Abstract
    A fast charging circuit for NiCd battery used in implant electronic systems is described. The circuit utilized the techniques of 1) sensing the internal gas pressure and temperature rise by sensing of the battery terminal voltage, and 2) setting the maximum charging current according to the concept of charge retention capacity, >95 percent after 100 cycles, of the battery. Experimental results show that a B-20 cell can be fully charged in 20 minutes instead of 14 hours.
  • Keywords
    Batteries; Electronic circuits; Gases; Implants; Integrated circuit reliability; Manufacturing; Power system reliability; Temperature sensors; Voltage; Cadmium; Electricity; Electronics, Medical; Nickel;
  • fLanguage
    English
  • Journal_Title
    Biomedical Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9294
  • Type

    jour

  • DOI
    10.1109/TBME.1970.4502761
  • Filename
    4502761